Altux™ CR
Improved Image Fidelity for Computed Radiography
CR PLATE GRAIN PATTERN REMOVAL
- Increases system CNR by removing phosphor grain pattern of the CR plate
CR FRAME AVERAGING
- Increases system CNR by applying a frame averaging technique using multiple image exposures
AUTOMATED VISIBILITY MEASUREMENTS
- Contrast to Noise measurements
- Hole Visibility Calculation
- Basic Spatial Resolution measurements
- X-ray Spot Size measurements
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In the figure above, Altux™ increases the CNR of the system by removing phosphor grain pattern of the CR plate.
For product information and pricing contact:
sales@lickenbrocktech.com
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