Imaging Solutions for Defense, Industry, and Life Sciences


Microfocus CT

Lickenbrock has developed CT techniques for imaging the structure of complex shaped metallics, monolithic ceramics and composite aerospace components in 3D at very high resolutions. This CT technology is capable of “seeing inside” complex shapes at resolutions less than 10um (0.0005 in.) in sizes up to 15cm (6 in.) in dimension. Besides providing for 3D nondestructive evaluation, the technique is useful for reverse engineering, rapid prototype testing, wall thickness analysis, 3D defect detection and advanced 3D measurements.

Computed Tomography Innovative Engineering (CTIE)

Lickenbrock is developing advanced CT software that will automate the detection of defects in sophisticated components from CT scans. This includes a specialized 3D viewer, an iterative reconstruction algorithm, and an automated nondestructive evaluation system (ANDES). Lickenbrock uses an advanced iterative reconstruction algorithm that produces superior resolving power and contrast compared to conventional CT algorithms. The project advances the capabilities of this algorithm by dramatically improving its speed, overall image quality performance and the reduction of artifacts caused by beam hardening and scatter.

SBIR Commercialization Readiness Program

Lickenbrock is developing microfocus cone beam CT software for general non-destructive evaluation techniques.  This will be a standalone software suite designed to leverage aerospace technology and medical advances for general component inspection.  The suite will feature all of Lickenbrock’s corrective tools and allow for quality assurance of a wide range of materials.

Multi-frame Blind Deconvolution for Ground Based Telescopes

Lickenbrock is developing a blind deconvolution approach that corrects blur in telescope images caused by atmospheric turbulence, optical aberrations, noise, and other factors. The solution will interface with the imaging feed and be able to correct images in real time at typical video streaming rates. This solution improves images so that finer detail can be seen without requiring a telescope upgrade.

Analysis of Integrated Circuits Using Limited X-rays

Lickenbrock conducted a project for non-destructively evaluating the construction of integrated circuits (IC).  Lickenbrock developed an acquisition scheme and software to enable faster “time to data”, while maintaining accurate reconstructions, for a lab X-ray microscope (XRM) system used to identify and map the conductors in ICs. Using a limited number of projection angles, an iterative algorithm was developed to reconstruct high-resolution images of a 9 layer, 90 nm technology IC.

3D Data Visualization

3D data visualization plays a large role in the analysis of CT reconstructions compared to the original 3D models. Lickenbrock’s 3D visualization software includes cropping, movie, rendering, display and aspect/sampling tools. An opacity tool allows the user to adjust the transparency of each intensity level. The user can examine different materials as well as interior parts of the reconstructed volume. A built-in 3D navigator gives the user the flexibility to view 2D slices in the XY, YZ, and ZY planes. This allows the user to quickly traverse a large dataset to examine critical regions of interest in high resolution and in 3D form.

High Energy CT

Lickenbrock has developed software for High Energy fanbeam CT. Several variations of reconstruction algorithms were developed that use different methods for filtering and interpolating the sinogram data. This includes super resolution CT reconstruction. The software can perform single and batch reconstructions on a single GPU or CPU. Lickenbrock also designed a set of measurement tools that include measurements for angle, area, intensity, tortuosity, line length and porosity. The software package also includes 2D and 3D image viewing tools.

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